Clock verification and substitution

Clock verification and substitution

Jitter and phase noise performance verification

Analog-to-digital and digital-to-analog converters (ADC/DAC) have taken giant steps in speed over the past decade. Sampling rates of 10 Gsamples per second at 16-bit resolution are seen. Such devices allow high-speed video processing and even software defined radio (SDR) applications where digitization is being performed at ever-higher RF frequencies. This has clearly raised the bar for clock generation and testing, especially with regard to jitter and noise performance.

Solutions for Clock verification and substitution

When you need an ideal clock source

Today's digital designs and data converters with high rates require clean clocks with minimal jitter.

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Comparison of jitter measurements in the time and frequency domain

Use jitter measurements in the time and frequency domain to differentiate between fast and slow moving artifacts.

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Verifying the clock source

The signal purity of clock sources has a direct impact on system performance and needs to be verified.

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A 1 MHz to 50 GHz Direct Down-Conversion Phase Noise Analyzer with Cross-Correlation

A new phase noise test solution covers the frequency range from 1 MHz to 50 GHz with direct down-conversion analog I/Q mixers and baseband signal sampling.

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Related products

R&S®SMA100B RF and microwave signal generator

The R&S®SMA100B RF and microwave signal generator delivers maximum performance without compromise.

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R&S®FSWP phase noise analyzer and VCO tester

The R&S®FSWP phase noise analyzer and VCO tester combines extremely low‑noise internal sources and cross‑correlation technology.

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R&S®RTO2000 oscilloscope

Offering bandwidths from 600 MHz to 6 GHz, R&S®RTO2000 oscilloscopes excel at both time domain and frequency domain testing.

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Related videos

First class ADCs thanks to first class signals

First class ADCs thanks to first class signals

This video presents how the R&S®SMA100B supports you in measuring the true performance of ADCs. The R&S®SMA100B provides you with purest signals. This makes ADC testing easy and helps you improving your products.

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Signals with lowest phase noise

R&S®SMA100B - Signals with lowest phase noise

Radar engineering, data converter testing, base station blocking tests - all of them require signals with lowest phase noise at the relevant offset frequencies.

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Demystifying 5G - Testing a 5G IF transceiver

Demystifying 5G – Testing a 5G IF transceiver

This video demonstrates how to test a discrete transceiver for 5G NR based on the latest data converters from Texas Instruments.

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Demystifying 5G - Testing the true performance of ADCs

Demystifying 5G - Testing the true performance of ADCs

The R&S®SMA100B RF and microwave analog signal generator from Rohde & Schwarz combines highest output power, lowest phase noise and lowest wideband noise making it ideal for high-resolution ADC/DAC testing as demonstrated in this video.

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Demystifying 5G - Wideband noise and its impact on testing the true performance of ADCs

Demystifying 5G - Wideband noise and its impact on testing the true performance of ADCs

This video focusses on wideband noise and its impact on the ADC performance.

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Related topics and solutions

Electronic design

Electronic engineers currently face ever more complex challenges when designing and developing integrated board architectures.

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Analog / digital design and test

Modern electronic designs integrate more functionality into less space, resulting in higher data rates and lower signal levels.

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RF & microwave component testing

Components need to address the challenging requirements of mobility, connectivity, highest data rates, robustness and power efficiency.

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