8 Results
R&S®Fxx-K30 Measure noise figure above 110GHz - Application Card
Rohde & Schwarz signal and spectrum analyzers equipped with the R&S®FSx-K30 option form the basis of a solution to accurately measure the noise figure in the millimeterwave frequency range using the Y-factor method.
EMI Measurement Application for Signal and Spectrum Analyzers - R&S®FSW-K54, R&S®FSV3-K54, R&S®FPL1-K54, R&S®FSV-K54 - Specifications
This document provides the technical specification of the EMI measurement application for signal and spectrum analyzers – R&S®FSW-K54, R&S®FSV3-K54, R&S®FPL1-K54, R&S®FSV-K54.
EMI Measurement Application for Signal and Spectrum Analyzers - R&S®FSW-K54, R&S®FSV3-K54, R&S®FPL1-K54, R&S®FSV-K54 - Product Brochure
The EMI measurement application (K54 option) adds EMI precompliance measurement functions to the following spectrum analyzers: R&S®FSW, R&S®FSVA3000, R&S®FSV3000, R&S®FPL1000 and R&S®FSVR. It is the ideal EMI analysis extension for product development and a smooth certification process. Typical application fields include commercial, automotive, avionics and military product development (CISPR, EN, FCC, DO‑160 and MIL-STD-461 standards).