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Phase Noise and Advanced Jitter Measurements Part 1
Phase Noise and Advanced Jitter Measurements Part 1

Presented by Oliver Voss and Alexander Küllmer, Rohde & Schwarz

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Basic Introduction to the new R&S®ELEKTRA test software, the Successor of the famous R&S®EMC32 Measurement Software
Basic Introduction to the new R&S®ELEKTRA test software, the Successor of the famous R&S®EMC32 Measurement Software

Presented by Martin Randrup Villadsen, Rohde & Schwarz

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R&S®RTM3000 - R&S®RTA4000 Spectrum Analysis and Spectrogram
R&S®RTM3000 - R&S®RTA4000 Spectrum Analysis and Spectrogram

The The R&S®RTM-K18 spectrum analysis and spectogram option makes it easy to find such errors quickly. Difficult-to- find faults often result from the interaction between time and frequency signal. The The R&S®RTM-K18 spectrum analysis and spectogram option makes it easy to find such errors quickly. Like on a spectrum analyzer, parameters such as center frequency and resolution bandwidth can be adapted

Video
R&S®RTM3000 - Power and harmonics analysis
R&S®RTM3000 - Power and harmonics analysis

The R&S®RTM3000 features analysis of input and output as well as transfer function of switched-mode power supplies. The R&S®RTM3000 features analysis of input and output as well as transfer function of switched-mode power supplies. Furthermore it offers the ability to analyse harmonic current in line with conventional EN, MIL and RTCA standards. Video, RTM3000, Oscilloscope, harmonic analysis The R

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Phasenoise and Advanced Jitter Measurements Part 2
Phasenoise and Advanced Jitter Measurements Part 2

Presented by Oliver Voss and Alexander Küllmer, Rohde & Schwarz

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How are SI, PI and EMI Related to Each Other
How are SI, PI and EMI Related to Each Other

Duration: 1 hour Language: EN

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VNA: Pulse Measurements and Analysis
VNA: Pulse Measurements and Analysis

Presented by Jamie Lunn, Rohde & Schwarz

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Which Probe to Choose for Digital and High-Voltage Applications
Which Probe to Choose for Digital and High-Voltage Applications

Presented by Alexander Küllmer and Pasi Suhonen, Application Engineers

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Bode Plot Measurements with Oscilloscopes
Bode Plot Measurements with Oscilloscopes

Presented by Kenneth Rasmussen, Rohde & Schwarz

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OTA Fundamentals and Rohde & Schwarz Solutions
OTA Fundamentals and Rohde & Schwarz Solutions

Duration: 1 hour Language: EN

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RF Connector Care and Good Practices
RF Connector Care and Good Practices

Presented by Jamie Lunn, Rohde & Schwarz UK Ltd

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CMsquares Sequencer - ONE Graphical Scripting Tool for All Your Automated 5G Testing Needs
CMsquares Sequencer - ONE Graphical Scripting Tool for All Your Automated 5G Testing Needs

Duration: 1 hour Language: EN

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Automotive Ethernet Measurements
Automotive Ethernet Measurements

Presented by Alexander Kuellmer - Application Engineer Digital Debug Tools

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Oscilloscope Fundamentals
Oscilloscope Fundamentals

Presented by Alexander Küllmer and Pasi Suhonen, Application Engineers

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VNA: Noise Figure Measurements
VNA: Noise Figure Measurements

Presented by Jamie Lunn, Rohde & Schwarz

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VNA: IQ Mixer Characterization
VNA: IQ Mixer Characterization

Presented by Thilo Bednorz, Rohde & Schwarz

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OTA Measurements for Base Stations
OTA Measurements for Base Stations

Presented by Markku Hintsala and Pontus Segerberg, Rohde & Schwarz

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Characterizing an ADAS Radar in a transportable CATR based fully anechoic chamber with best-in-class performance
Characterizing an ADAS Radar in a transportable CATR based fully anechoic chamber with best-in-class performance

Presented by Fabricio Dourado, Rohde & Schwarz

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Automotive Radar, Chirp Generation and Analysis
Automotive Radar, Chirp Generation and Analysis

Presented by Oliver Voss and Alexander Küllmer, Rohde & Schwarz

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Rohde & Schwarz Finland Oy
Rohde & Schwarz is striving for a safer and connected world with its leading-edge solutions. Committed to innovation for more than 90 years, the independent technology group acts long-term and sustainably, making it a reliable partner to its industry and government customers worldwide.
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