RF Testing Innovations Forum: Elevate your RF Expertise

Date

May 20, 2026
9:00 - 13:00

Register now

Location

Online

Info

Language: English
Free of charge

Virtual event

RF Testing Innovations Forum: Elevate your RF Expertise

May 20, 2026 – Online Event

With the growing use of satellite communications and defense systems, RF testing is becoming increasingly critical and complex.

The virtual RF Testing Innovations forum, taking place on May 20,2026, brings together engineers and specialists to discuss practical solutions for today’s most demanding applications.

What You’ll Learn

Absolute phase measurements across a wide frequency range
Sub‑THz on‑wafer testing methods and best practices
Noise‑parameter validation techniques
Residual‑measurement approaches for high‑performance RF components

Why Attend?

Get direct answers to the technical questions you face in your projects.
Gain actionable knowledge that reduces development risk and accelerates time‑to‑market.
Access recordings of all sessions after the event, so you can review the material at your own pace.

Don't miss this opportunity to enhance your expertise and network with industry leaders at the forefront of RF innovation.

Register now

RF Testing Innovation Forum 2026 Teaser LIVE

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Agenda

Time	Conference	Speaker
9.00	Opening
9.05	Keynote: The Commercialization of specialized Aerospace and Defense Components The growth in satellite communications and defense applications requires more RF systems and thus driving the need for dedicated RF components for these demanding applications. We will start with block diagrams comparing different RF subsystems and derive specific test requirements with the goal to simplify and accelerate time to market addressing the growth requirements in the aerospace and defense market space.	Rohde & Schwarz, Markus Lörner
9.30	Mastering RF Test validation for a power amplifier: From measurement to simulation and from S-Parameters to Complex Modulated Signals Characterizing RF devices require accurate data and simulation-ready models. To validate an RF power amplifier, various test cases. We look at a holistic view orchestrating the complete test bench. Managing multi-instrument test setups with interchangeable or updated devices complicates operations and can disrupt workflows, especially with in-house software solutions. A unified orchestration platform is essential: it must manage all data, from S-parameters to complex modulated signals, adapt to various instruments, and ensure long-term maintainability. Comprehensive control software optimizes return on investment (ROI) by sequencing tests, supporting different architectures, and enabling high-fidelity simulations, while futureproofing your test bench.	Dassault, Tony Gasseling
10.10	Absolute Phase: The Role of Clear Phases and Calibration This session focuses on the critical importance of phase information in RF measurements, often overlooked in favor of amplitude alone. We'll motivate the need for calibrated phases, overview calibration approaches with a detailed look at comb generators and their traceability and explore applications through case studies. These include time-domain transformations, frequency-converter validation, and instrument-specific considerations for VNAs.	Rohde & Schwarz, Thorsten Lück
10.50	Break
11.00	Achieving accurate and repeatable D-Band on-wafer measurements As multi gigabit digital communication systems push into ever higher frequencies, test engineers need to extend the limits of on wafer S parameter measurements to accurately model and characterize devices. This presentation covers best practices for achieving accurate, stable, and repeatable D band on wafer S parameter measurements using a Rohde & Schwarz ZNA with 170 GHz frequency extenders. We’ll take you inside the FormFactor labs in Dresden, Germany, for a live demonstration and highlight the critical measurement decisions along the way.	FormFactor, Giancarlo De Chirico/ Gavin Fisher
11.40	Residual Measurements for Component Testing Many test setups for active device characterization require driver amplifiers to provide sufficient input power to the DUT. With a signal source, a driver amplifier, and the actual DUT itself, you may have up to three active devices contributing to your test results. Residual measurements directly compare the DUT output against the DUT input and thus eliminate the influence of any component before the DUT. The concept applies to frequency converting and non-frequency converting devices. The new R&S FSWX enables residual measurements in an easily accessible and accurate way. Learn about the wide use cases and experience in live demos the benefit of this new approach.	Rohde & Schwarz, Florian Ramian
12.20	Optimizing RF Designs: Noise validation in RF circuit using up to 67 GHz As LNA performance demands increase due to emerging applications in LEO satellite communications, remote sensing, and quantum computing, achieving accurate and reliable noise measurements becomes increasingly critical, since the LNA is typically the first stage of the receiver and largely determines the overall receiver noise performance and sensitivity. Accurate characterization of LNAs therefore requires precise extraction of their noise parameters, particularly for devices exhibiting extremely low minimum noise figures. This talk presents the fundamental principles of noise measurement and the extraction of noise parameters using the cold source method. Measurements are performed using the latest R&S ZNA vector network analyzer with the K30 noise figure measurement option. Emphasis is placed on calibration and verification techniques to ensure traceability, accuracy, and measurement confidence across diverse device technologies and wide frequency bands.	Focus Microwaves, Mehrdad Harifi-Mood
13.00	Closing

Rohde & Schwarz presenters

Markus Lörner, Market Segment Manager – RF & Microwave Components

Markus Lörner is a Market Segment Manager at Rohde & Schwarz focusing on the RF and Microwave Component market looking at the test requirements today and tomorrow. Markus has 25 years plus experience in the test & measurement industry. Before moving into the market segment role, Markus worked as a product manager for signal generators and power meters at Rohde & Schwarz where he was looking at different application areas including the mobile industry, positioning, satellite and EW applications. He received his Dipl.-Ing. degree from the University Erlangen-Nuremberg, Germany.

Thorsten Lück, Senior Project Manager High‑End Vector Network Analyzers

Thorsten Lück is Senior Project Manager for high‑end vector network analyzers at Rohde & Schwarz (since 2018). He leads product development and systems engineering for precision VNA instruments, with emphasis on instrument architecture, S‑parameter metrology, calibration, uncertainty quantification, and measurement automation. He collaborates with academic and industrial partners to translate measurement science into deployable solutions. Earlier he spent nearly 20 years in satellite navigation, developing a Galileo test receiver and leading an ESA‑funded signal‑integrity testbed.

Florian Ramian, Development Engineer

Florian Ramian is a Development Engineer at Rohde&Schwarz, primarily focusing on the analysis of non-linear DUTs. Florian has 20 years of experience as an RF engineer including R&D for automotive radars as well as 15+ years of test and measurement experience. Before moving into R&D he held several positions as an Application Engineer for R&S Spectrum & Signal-Analyzers and Researcher at TU München. He received his Dr.-Ing. and Dipl.-Ing. degrees both from Technische Universität München.

Partners presenters

Tony Gasseling, SIMULIA R&D Technical Director, Dassault Systèmes

Tony Gasseling is SIMULIA R&D Technical Director at Dassault Systèmes, specializing in advanced modeling of nonlinear RF devices using innovative measurement techniques. With over 20 years of experience in semiconductor measurement and modeling (Pulse IV, Load Pull…), he previously served as CEO of AMCAD Engineering. Tony holds a PhD from XLIM Lab (University of Limoges) and an Executive Master in Digital Marketing from HEC Paris.

Giancarlo De Chirico, Director of Strategic Partnerships Probe Systems Business, FormFactor

Giancarlo De Chirico is the Director of Strategic Partnerships in the Probe Systems Business Unit at FormFactor. He has 14 years of experience in network analysis and characterization of RF, microwave, and mm-wave devices. He has hosted numerous seminars and workshops on component characterization techniques. Before joining FormFactor in 2022, Giancarlo served as a Director at Keysight Technologies and was responsible for the growth of the Aerospace & Defense Device/Component Test and Military ATE industries. He holds a Master's Degree in Electronics Engineering from Politecnico di Milano (Italy) and a Bachelor's in Electronics Engineering from Politecnico di Bari (Italy).

Gavin Fisher, Applications Specialist, FormFactor

Gavin Fisher is an applications specialist at FormFactor’s centre of expertise with responsibility for the RF applications. He provides application support and technical services to customers, in addition to evaluating and assisting in product development. With more than two decades of experience in Cascade / Formfactor probe systems, he has a broad spectrum of application knowledge in high-frequency measurement, calibration, automation and power device measurement. He educates and trains customers on best practices to achieve accurate measurement results. He has made several presentations at European Microwave Week, International Microwave Symposium, and MOS-AK workshops. Prior to joining Formfactor, he served at Alenia Marconi Systems in the radar systems division.

Mehrdad Harifi-Mood, RF Engineer, Focus Microwaves

Mehrdad Harifi-Mood received the B.Sc. degree in electrical engineering–electronics and the M.Sc. degree in electronics–IC design from the University of Birjand, Iran, in 2017 and 2020, respectively, and the Ph.D. degree in telecommunications from the Institut national de la recherche scientifique (INRS), Université du Québec, Montreal, Canada, in 2025. His doctoral research focused on the design of integrated circuits for noise measurement applications, with emphasis on linearity, reliability, and performance at mm-wave frequencies for laboratory measurement systems. He is currently with Focus Microwaves, Montreal, Canada, where he is a member of the RF engineering team, working on noise measurement techniques and the development of advanced noise measurement systems.

Partners

FormFactor

Focus Microwaves

Dassault Systemes

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