Key facts
With the wideband modulated load-pull solution from Rohde & Schwarz, you can overcome the limitations of traditional tuner-based methods. Indeed, in presence of high signal bandwidths (around 100 MHz and above) conventional load-pull setups, consisting of vector signal analyzer and passive tuners, present significant frequency response and group delay in amplitude and phase. This leads to substantial measurement uncertainties. By using the R&S RTP oscilloscope and the R&S SMW signal generator, Rohde & Schwarz solution eliminates those barriers and enables fast and reliable wideband modulation characterization of power amplifiers and RF frontends across varying impedances.
The new R&S®wideband modulated load pull solution is based on a software option, R&S®RTP-K98, which enables to perform wideband modulated load-pull measurements with a setup based on general-purpose instruments, such as R&S®RTP oscilloscope and R&S®SMW200A vector signal generator. Optional R&S®SAM100 system amplifier can be add to expand the range of applicability.
The R&S®RTP-K98 software runs as part of R&S®ScopeSuite software on an external PC or on the operating system of the R&S®RTP oscilloscope. It's particularly easy to use it, thanks to guided step-by-step procedures and the intuitive user interface. Additionally, the setup can accomodate expansions, such as Envelope Tracking (requiring an additional R&S®SMW200A vector signal generator), and it can also be controlled via API (Python or C#).
As an oscilloscope-based solution, the R&S®RTP-K98 overcomes the limitations of conventional load-pull for wideband modulated tests, offering advantages in accuracy and speed over tuners, and true wideband source and receiver capability in real time measurements. The solution runs up to 2GHz bandwidth, with a frequency range up to 8 GHz.
The outcome of the measurements comes in form of a report, including visual representation of the Gamma error vs frequency, also plotted onto a Smith chart. Additionally, the software provides preliminary measurements of the DUT parameters, such as EVM, ACLR, PAPR.
All data can be exported into an open format (hdf5) and analyze it with external tool, enabling maximum transparency and flexibility to realize contour plot graphs and other visual representations, according to your needs.
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