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This document provides the technical specifications of the R&S®VSE-K60 | R&S®VSE-K60C | R&S®VSE-K60H, of the R&S®FSW-K60 | R&S®FSW-K60C | R&S®FSW-K60H and of theR&S®FSWP-K60 | R&S®FSWP-K60C | R&S®FSWP-K60H.
This document provides the technical specifications of the R&S®FSx-K50 spurious measurement application.
Enhanced Specifications for AM/FM/φM Modulation Analysis
The R&S®FS-SNS smart noise sources enable simple and accurate noise figure and gain measurements by automatically loading all necessary setup parameters and taking the environmental temperature into account. Measurement uncertainty is calculated automatically and can even be displayed on the result screen.
Technical specifications of the noise figure measurement options for the R&S®Fxx signal and spectrum analyzers and the R&S®ZNL vector network analyzer from Rohde & Schwarz
The R&S®VSE-K70 option enables users to flexibly analyze digitally modulated single carriers down to the bit level. The clearly structured operating concept simplifies measurements, despite the wide range of analysis tools.
The R&S®VSE-K6 option measures all relevant parameters such as pulse duration, pulse period, pulse rise and fall times, power drop across a pulse, and intrapulse phase modulation, and produces a trend analysis over many pulses. The user selects which results should be displayed simultaneously on the screen. The R&S®VSE thus delivers a full picture of e.g. a radar system within seconds.