Oscilloscope Days 2024

Opening Keynote

Speaker: Prof.Kallfass from University of Stuttgart

Abstract: Application-Oriented Power Cycling of Wide Bandgap Power Semiconductor Devices

Part 1: Test and Setup design challenges

Session a: Measurements of Currents and High voltages

Speaker: Nicholas LeBas from Rohde & Schwarz

Abstract:

• How to adapt my test setups to wide bandgap materials like SiC or GaN?
• Which dynamic range do I need?
• Do I need an optical isolated Probe?

Part 1: Test and Setup design challenges

Session b: Loop compensation - Buck Converter Design and Measurements

Speakers: Robert Schillinger & Mohamed Al-Alami from Würth Elektronik

Abstract:

• Control theory & stability criteria
• VMC Buck transfer function
• Compensator design
• Practical Buck loop measurements using Oscilloscope Bode Analysis
• Time domain transient response for different compensators

Part 2: How to ensure EMC

Session a: Spectrum analysis using oscilloscopes

Speaker: Sofia Perez-Simbor from Rohde & Schwarz

Abstract:

• Why use an oscilloscope for Spectrum analysis?
• How much bandwidth does my oscilloscope need?
• How to estimate the needed bandwidth?
• How can the frequency range be extended?

Part 2: How to ensure EMC

Session b: Design for EMC - Boost converter Design and Measurements

Speakers: Robert Schillinger and Mohamed Al-Alami from Würth Elektronik

Abstract:

• Noise measurement time vs. frequency domains
• Component parasitic contributions to noise
• Impact of layout, tracking and filtering
• Common and differential mode measurements using the Oscilloscope FFT analysis

Part 3: Verification of System Parameters

Session a: Test automation in Power electronics

Speaker: Jens Schweickhardt from PE-Systems

Abstract:

• How to get proper data for Modelling of Semicon-ductors and full devices?
• How to increase testing speed?
• How to select the right components for your System?

Part 3: Verification of System Parameters

Session b: Measurement fundamentals on SMPS

Speaker: Alexander Küllmer from Rohde & Schwarz

Abstract:

• Which measurements are popular?
• Why consider Power factor and power quality?
• What to keep in mind when designing the test setup?

Part 4: Signal Integrity debugging

Session a: How to debug SI with PI?

Speaker: Pasi Suhonen from Rohde & Schwarz

Abstract:

• How are SI and PI linked together?
• How to draw eye diagrams?
• Take a closer look on your system by usage of Jitter separation

Part 4: Signal Integrity debugging

Session b: The Gigabit Ethernet Interface under EMC Aspects

Speaker: Adrian Stirn from Würth Elektronik

Abstract:

• Short Overview: The Gigabit Ethernet Frontend of the Reference Design RD016.
• Different shielding connections of the Gigabit Ethernet Interface and impact on the EMI performance.
• Measurement of the Gigabit Ethernet and the USB3.1 Interface with the Scope.