R&S®FSV-K30 Noise Figure and Gain Measurements

  • Overview
The schematic view of the test setup simplifies measurements on frequency-converting DUTs.
The schematic view of the test setup simplifies measurements on frequency-converting DUTs.
Tabular representation of measurement results.
Tabular representation of measurement results.
Measurements on an amplifier.
Measurements on an amplifier.
The schematic view of the test setup simplifies measurements on frequency-converting DUTs.Tabular representation of measurement results.Measurements on an amplifier.

Key Facts

The R&S®FSV-K30 option expands the R&S®FSV or R&S®FSVA signal and spectrum analyzer by adding measurement functionality otherwise only provided by special noise measurement analyzers.

Key Facts

The R&S®FSV-K30 option expands the R&S®FSV or R&S®FSVA signal and spectrum analyzer by adding measurement functionality otherwise only provided by special noise measurement analyzers.

The following parameters can be measured at a specified frequency or in a selectable frequency range:

  • Noise figure in dB
  • Noise temperature in K
  • Gain in dB

The R&S®FSV-K30 can perform a wider variety of RF measurements than is possible with conventional noise measurement systems. The R&S®FSV and R&S®FSVA support the measurement of harmonics, intermodulation, spurious responses and many other RF-relevant criteria (for measurements on amplifiers and on frequency-converting DUTs, e.g. lownoise converters).

  • Noise measurements
    • Measurement range 0 dB to 35 dB
    • Resolution 0.01 dB
    • Device measurement uncertainty 0.05 dB
  • Gain measurements
    • Measurement range –20 dB to +60 dB
    • Resolution 0.01 dB
    • Measurement accuracy ±0.2 dB

The schematic view of the test setup simplifies measurements on frequency-converting DUTs.
Tabular representation of measurement results.
Measurements on an amplifier.
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