High-speed digital interface testing, DDR testing

DDR – double data rate memory

Efficiently verify and debug your DDR design

Design verification and debugging - Compliance testing

The need for increasing speed, higher memory size and power efficiency is driving the evolution in DDR and LPDDR interface technology as defined by JEDEC. Working closely with JEDEC, Rohde & Schwarz provides powerful solutions for DDR compliance testing.

As part of the overall design, DDR memory controller and memory devices also need to properly work in the presence of other high-speed interfaces or even wireless signals. In addition to compliance testing, Rohde and Schwarz DDR test solutions help you efficiently verify and debug your design at the board and system level.

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Related videos
DDR3 signal integrity debugging

DDR3 signal integrity debugging with the R&S®RTP

Signal integrity debugging on a DDR3 device using the R&S®RTP-K91 DDR3/LPDDR3 signal integrity debug and compliance test software.

Realtime deembedding

Real-time deembedding with the R&S®RTP

Realtime deembedding of a signal path with the R&S®RTP-K122 option. The R&S®RTP not only acquires deembedded waveforms, it also allows triggering on this deembedded signal.

Signal integrity measurements with jitter analysis

Jitter analysis with the R&S®RTO

Measurement of TIE jitter with the R&S®RTO-K12 option. Analysis of TIE jitter of a clock signal in statistics, track, histogram and spectrum view to detect disturbances on the clock.

Eye diagram analysis with the R&S®ZNB: introduction

Eye diagram analysis with the R&S®ZNB: introduction

Eye diagram measurements and eye mask testing with the R&S®ZNB-K20 extended time domain option. This option can be used to analyze jitter and noise as well as to apply emphasis and equalization on the measured eye diagram.

Eye diagram analysis with the R&S®ZNB: how to set up the measurements

Eye diagram analysis with the R&S®ZNB: how to set up the measurements

Eye diagram measurements and eye mask testing with the R&S®ZNB-K20 extended time domain option. This option can be used to analyze jitter and noise as well as to apply emphasis and equalization on the measured eye diagram.

Signal integrity testing on differential signal structures with the R&S®ZNB

Signal integrity testing on differential signal structures with the R&S®ZNB

Measurement of rise time, impedance, intra-pair skew, inter-pair skew, etc. with the R&S®ZNB-K20 extended time domain option.

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