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On-wafer qualification of RF components

Early wafer-level qualification of RF components ensures quality and saves money

English - Jul 14, 2022

On-wafer characterization at sub-THz frequencies

On-wafer characterization at sub-THz frequencies

English - Dec 12, 2023

Three-port on-wafer mixer measurements up to the THz range on MPI probe stations

Three-port on-wafer mixer measurements up to the THz range on MPI probe stations

English - Aug 14, 2025

Differential RF on-wafer measurements up to 110 GHz on MPI probe stations

Differential RF on-wafer measurements up to 110 GHz on MPI probe stations

English - Aug 14, 2025

On-wafer testing - Fact Sheet

English - Aug 18, 2025

807 kB | PDF
Measurements on devices with very high noise figure

This application note describes a technique to perform the noise figure measurement with FSW-K30 on lossy devices like attenuators with high loss in front of the low noise amplifiers.

English - Jun 24, 2020

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