R&S®FSWP Phase Noise Analyzer and VCO Tester

High‑end analysis of signal sources and components

Key Facts

  • Frequency range from 1 MHz to 8/26.5/50 GHz
  • High sensitivity for phase noise measurements thanks to cross‑correlation and extremely low‑noise internal reference sources
  • Simultaneous measurement of amplitude noise and phase noise

Brief Description

The R&S®FSWP phase noise analyzer and VCO tester combines extremely low‑noise internal sources and cross‑correlation technology, delivering extremely high sensitivity for phase noise measurements.

Features

  • Measuring phase and amplitude noise with high sensitivity
  • Phase noise measurements on pulsed sources at the push of a button
  • Internal source for measuring additive phase noise, also on pulsed signals

Specifications

Model Frequency Range
R&S®FSWP8 1 MHz to 8 GHz
R&S®FSWP26 1 MHz to 26.5 GHz
R&S®FSWP50 1 MHz to 50 GHz

Key Facts

  • Frequency range from 1 MHz to 8/26.5/50 GHz
  • High sensitivity for phase noise measurements thanks to cross‑correlation and extremely low‑noise internal reference sources
    • typ. –172 dBc (1 Hz) at 1 GHz carrier frequency and 10 kHz offset
    • typ. –158 dBc (1 Hz) at 10 GHz carrier frequency and 10 kHz offset
  • Simultaneous measurement of amplitude noise and phase noise
  • Measurement of phase noise on pulsed sources at the push of a button
  • Internal source for measuring additive phase noise, including on pulsed signals
  • Signal and spectrum analyzer and phase noise analyzer in a single box
    • High‑end signal and spectrum analyzer, 10[nbsp]]Hz to 8/26.5/50 GHz
    • Wide dynamic range thanks to low displayed average noise level (DANL) of –156 dBm (1 Hz) (without noise cancellation) and high TOI of typ. 25 dBm
    • 80  MHz signal analysis bandwidth
    • Total measurement uncertainty: < 0.2 dB up to 3.6 GHz,< 0.3 dB up to 8 GHz
    • Touchscreen operation
    • Large 12.1" display for simultaneous viewing of multiple measurement windows
    • Various measurement applications can be run and displayed in parallel
  • High measurement speed
  • Low‑noise internal DC sources for VCO characterization
  • Automatic VCO characterization
  • Analysis of up to 8 GHz wide frequency hops (transients)

Brief Description

The R&S®FSWP phase noise analyzer and VCO tester combines extremely low‑noise internal sources and cross‑correlation technology, delivering extremely high sensitivity for phase noise measurements. As a result, it takes just seconds to measure even highly stable sources such as those found in radar applications. Additional options such as pulsed signal measurements, additive phase noise (including pulsed) characterization and integrated high‑end signal and spectrum analysis make the analyzer a unique test instrument.

Features & Benefits

  • Measuring phase and amplitude noise with high sensitivity
    • Extremely low phase noise from internal sources
    • Cross‑correlation to improve phase noise sensitivity
    • Accuracy of amplitude noise measurements significantly higher than with diode detectors
    • Display of improvement in sensitivity through cross‑correlation
    • Up to 300 MHz frequency offset for phase noise measurements, up to 1 GHz for pure noise measurement
  • Phase noise measurements on pulsed sources at the push of a button
    • Simple test setup
    • High sensitivity despite desensitization
    • Automatic pulse parameter measurement
  • Internal source for measuring additive phase noise, also on pulsed signals
    • Simple and fast measurement
    • Higher sensitivity through cross‑correlation
    • Residual phase noise on pulsed signals
    • Additional inputs for an external source
  • Signal and spectrum analyzer and phase noise analyzer up to 50 GHz in a single box
    • Simple, cost‑optimized test setup
    • A worthwhile investment
    • High-end signal and spectrum analyzer
  • High measurement speed
    • Perfect for production applications
    • Faster development
  • Low‑noise internal DC sources for VCO characterization
    • Complete VCO characterization
    • Measuring higher harmonics
    • Phase noise relative to the tuning voltage
  • Measuring transients or frequency hops (transient analysis)
    • Up to 8 GHz bandwidth for frequency and phase analysis
    • Triggering on phase or frequency deviation

Specifications

Base unit
Frequency
Frequency range, RF input
Phase noise, amplitude noise measurement R&S®FSWP8 1 MHz to 8 GHz
  R&S®FSWP26 1 MHz to 26.5 GHz
  R&S®FSWP50 1 MHz to 50 GHz
Phase noise measurement    
Measurement results   SSB phase noise, spurious signals, integrated RMS phase deviation, residual FM, time jitter
Offset frequency range input signal ≤ 1 GHz 10 mHz to 30 % of carrier frequency
  input signal > 1 GHz 10 mHz to 300 MHz
Phase noise sensitivity with R&S®FSWP-B60 option (no. of correlations = 1, start offset = 1 Hz)1)
RF input frequency Offset from carrier
  1 Hz 10 Hz 100 Hz 1 kHz 10 kHz 100 kHz 1 MHz 10 MHz ≥ 30 MHz
10 MHz –96 –128 –140 –158 –170 –170 –170
100 GHz –76 –108 –136 –163 –170 –173 –175 –175 –175
1 GHz –56 –88 –116 –143 –166 –173 –173 –173 –173
3 GHz –46 –78 –106 –133 –156 –158 –163 –170 –170
7 GHz –39 –71 –99 –130 –152 –153 –157 –166 –166
10 GHz –36 –68 –96 –128 –147 –150 –155 –173 –173
16 GHz –32 –64 –92 –124 –143 –146 –151 –170 –170
26 GHz –28 –60 –88 –120 –139 –142 –147 –166 –166
50 GHz –22 –54 –82 –114 –133 –136 –141 –160 –160
Phase noise sensitivity with R&S®FSWP-B61 option (no. of correlations = 1, start offset = 1 Hz)1)
RF input frequency Offset from carrier
  1 Hz 10 Hz 100 Hz 1 kHz 10 kHz 100 kHz 1 MHz 10 MHz ≥ 30 MHz
10 MHz –108 –130 –142 –160 –170 –170 –170
100 MHz –92 –115 –140 –166 –170 –173 –175 –175 –175
1 GHz –72 –95 –120 –150 –166 –173 –173 –173 –173
3 GHz –62 –85 –110 –140 –156 –158 –163 –170 –170
7 GHz –55 –78 –103 –133 –152 –153 –157 –166 –166
10 GHz –52 –75 –100 –133 –152 –153 –157 –173 –175
16 GHz –48 –71 –96 –129 –148 –149 –153 –170 –171
26 GHz –44 –67 –92 –125 –144 –145 –149 –166 –167
50 GHz –38 –61 –86 –119 –138 –139 –143 –160 –161
Amplitude noise measurement
Offset frequency range input signal ≤ 100 MHz 10 mHz to 30 % of carrier frequency
  input signal > 100 MHz 10 mHz to 30 MHz
AM noise sensitivity1)
RF input frequency Offset from carrier
  1 Hz 10 Hz 100 Hz 1 kHz 10 kHz 100 kHz 1 MHz 10 MHz 30 MHz
1 GHz –105 –120 –135 –150 –158 –165 –165 –165 –165
Residual phase noise measurement (R&S®FSWP-B64 option), internal source
Signal source
Frequency range R&S®FSWP8 10 MHz to 8 GHz
  R&S®FSWP26 10 MHz to 18 GHz
  R&S®FSWP50 10 MHz to 18 GHz
Additive phase noise measurement
Offset frequency range input signal ≤ 100 MHz 10 mHz to 30 % of carrier frequency
  input signal > 100 MHz 10 MHz to 30 MHz
AM noise sensitivity1)
RF input frequency Offset from carrier
  1 Hz 10 Hz 100 Hz 1 kHz 10 kHz 100 kHz 1 MHz 3 MHz
1 GHz –115 –123 –137 –147 –160 –165 –165 –161
10 GHz –85 –104 –120 –138 –148 –154 –164 –160

1) Values in dBc (1 Hz).

R&S®FSWP-B1 signal and spectrum analyzer option
Frequency range R&S®FSWP8 10 Hz to 8 GHz
  R&S®FSWP26 10 Hz to 26.5 GHz
  R&S®FSWP50 10 Hz to 50 GHz
Aging per year   ±1 × 10 –7/year
  with R&S®FSWP-B4 option ±3 × 10 –8/year
Resolution bandwidths standard filter 1 Hz to 10 MHz with R&S®FSWP-B8 option: 20 MHz, 50 MHz, 80 MHz additionally
  RRC filter 18 kHz (NADC), 24.3 kHz (TETRA), 3.84 MHz (3GPP)
  channel filter 100 Hz to 5 MHz
  video filter 1 Hz to 10 MHz
I/Q demodulation bandwidths   10 MHz
  with R&S®FSWP-B80 option 80 MHz
Displayed average noise level (DANL) 2 GHz typ. –150 dBm (1 Hz)
  8 GHz typ. –150 dBm (1 Hz)
  20 GHz typ. –145 dBm (1 Hz)
  40 GHz typ. –137 dBm (1 Hz)
DANL with preamplifier 8 GHz typ. –162 dBm (1 Hz)
  20 GHz typ. –160 dBm (1 Hz)
  40 GHz typ. –156 dBm (1 Hz)
Phase noise 1 GHz carrier frequency, 10 kHz offset typ. –138 dBm (1 Hz)
Total measurement uncertainty < 8 GHz < 0.4 dB
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