The recent developments in cellular and non-cellular standards are clearly showing a trend towards higher signal bandwidths and the use of higher-order modulation schemes. As a direct consequence, the EVM performance requirements are becoming much more stringent and the measurement setups for chip and RF component characterization have to cope with these arising challenges.
In this webinar, we have a closer look at these challenges and how they have a direct impact on the performance requirements for the test equipment. Furthermore, we present an innovative noise cancellation technique that R&S is deploying on its high-end signal and spectrum analyzers, so that they can better address the emerging requirements.