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Describes all instrument functions and remote control commands, including measurement and programming examples, for the base unit and all applications (except for compliance tests).

The application fields of oscilloscopes extend to EMI debugging because of their powerful and easy-to-use FFT analysis capabilities– and save time and money.

23-Sep-2019

Differential measurements with Spectrum Analyzers and Probes

28-Jun-2013 | AN-No. 1EF84

Ethernet communications has been introduced in automotive networks to enable fast and cost efficient data communications.

27-Mar-2015

This application note describes the configuration of a Miracast wireless video transmission system and how to measure delay times.

01-Oct-2015 | AN-No. 1MA250

This document provides the technical specifications of the R&S®FSW3-KM107/R&S®Fxx-K7/ESW-K7/VSE-K7/RTO AM/FM/PM modulation analysis option.

Read this application card to learn more about what the 10BASE-T1S Ethernet compliance test offers and how it ensures reliable operation and functionality.

15-May-2020

Video Overview for RTO6 product videos.

Video Overview for RTO2000 product videos.

21-Jun-2023 | Press Releases | Test & measurement

Rohde & Schwarz and Zurich Instruments will present advanced test and measurement solutions for photonics at the LASER World of PHOTONICS tradeshow in Munich. Highlighted solutions include the R&S FSPN and R&S FSWP, two exceptionally powerful phase noise analyzers for characterizing laser systems. Visitors can also see demos of the R&S MXO 4 and R&S RTO6 oscilloscopes from Rohde & Schwarz as well as the Quantum Computing Control System (QCCS) and lock-in amplifiers from Zurich Instruments.

This application note aims to explain test procedures and characterization of the relevant parameters for active phased array antennas.

04-Jul-2016 | AN-No. 1MA248

This application note highlights various aeronautical radio navigation signals such as VHF omnidirectional radio range (VOR), instrument landing system (ILS) for glide slope (GS) and localizer (LLZ), as well as marker beacon (MB).

01-Feb-2012 | AN-No. 1MA193

R&S®RT-Zxx Oscilloscope Adapters - Specifications

Assisting Tools for Operation of Windows-Based T&M Instruments

13-Jun-2013 | AN-No. 1MA218

04-Mar-2025 | Press Releases | Wireless communications

To showcase the potential of network energy saving (NES) in open radio access networks (O-RAN), Rohde & Schwarz and VIAVI Solutions have collaborated with Analog Devices. At Mobile World Congress 2025 in Barcelona, visitors can experience the joint O-RU test solution of the two T&M companies as it verifies the low power consumption of Analog Devices’ new Titan O-RU platform according to ETSI specifications. These network energy saving tests help to significantly reduce energy consumption and OPEX in O-RAN integrations.

Models: R&S®RTO-K26, R&S®RTO6-K26, R&S®RTP-K26, R&S®RTO-K27, R&S®RTO6-K27, R&S®RTP-K27

This application note introduces the IVI High Speed LAN Instrument Protocol (HiSLIP) and outlines its features. HiSLIP is the successor to the VXI-11 LAN remote control protocol. This document also describes guidelines for using this protocol.

12-Nov-2014 | AN-No. 1MA208

Models: R&S®RTO-K92, R&S®RTO6-K92

Models: R&S®RTO-K87, R&S®RTP-K87, R&S®RTO6-K87

Models: R&S®RTP-K89, R&S®RTO-K89, R&S®RTO6-K89

Models: R&S®RTO-K88, R&S®RTP-K88, R&S®RTO6-K88

Models: R&S®RTP-K25, R&S®RTO-K25, R&S®RTO6-K23

Models: R&S®RTO-K24, R&S®RTP-K24, R&S®RTO6-K24

Models: R&S®RTO-K86, R&S®RTP-K86, R&S®RTO6-K22

Models: R&S®RTP-K81, R&S®RTO-K81, R&S®RTO6-K81, R&S®RTP-K83

R&S RT-Zxx High Bandwidth Probes - Specifications

11-Jun-2024 | Press Releases | Test & measurement

Rohde & Schwarz has developed the R&S RT-ZISO isolated probing system for extremely accurate measurements of fast switching signals, especially in environments with high common-mode voltages and currents.

27-May-2024 | Press Releases | Test & measurement

Rohde & Schwarz will showcase its latest solutions for power electronics testing at PCIM Europe in Nuremberg, addressing challenges of testing and debugging the next generation of wide bandgap semiconductors in power electronic converters.

Describes the test procedures to perform eMMC compliance tests.