Electronic Design testing – get in touch with the R&S®MXO 5

Electronic design

Get in touch with the R&S®MXO 5

Test and measurement solutions to address the electronic circuit developers needs

Today’s world is driven by the latest industrial and economic technologies and trends such as IoT, Industry 4.0 and green energy on the one hand, and by fundamental changes in personal lifestyle such as e-health, e-mobility, smart homes, smart cities and social media on the other hand. All these trends create a strong demand for a new generation of electronic devices that address the challenging requirements of wearability, mobility, connectivity, performance, power efficiency, robustness and highest data rates.

As a direct result of these demands, electronic engineers currently face ever more complex challenges when designing and developing integrated board architectures. Our comprehensive and sophisticated test and measurement solutions include classical lab equipment and handheld tools and address numerous applications in the field of

  • Analog / digital design and testing
  • Digital bus and interface standards
  • Power electronics

If you have any further questions, please contact us.

Our solutions

Digital design testing

Choose from our complete test and measurement solutions for signal & power integrity, digital bus and interface standards, stimulation and analysis of analog/digital signals, EMC debugging and Data Converter Design.

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High-speed digital interface testing

High-speed digital interfaces are at the core of all electronic designs. Increasing data rates and growing integration density create new challenges for designs at the IC, board and system level.

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Power electronics

Manage all aspects of power electronics testing with our solutions for embedded power electronics & ICs, electronic installations & lighting and electric drives.

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Comprehensive testing of DOCSIS 3.1 Cable Modem Termination Systems (CMTS), cable network amplifiers, lasers, network components and cabel modems.

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Video center

Get access to interesting videos and webinars about solutions, applications and products.

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Download Center

Search the Rohde & Schwarz download center for brochures, datasheets, technical papers, manuals, firmware, software, drivers, and more.

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The Rohde & Schwarz Technology Academy

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Practical knowledge. Industry insight. Real experts. Only with the Rohde & Schwarz Technology Academy.

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Webinar: Fundamentals of VNA measurements

Webinar: Fundamentals of VNA measurements

This webinar is designed for engineers who need to characterize RF components such as cables, filters, and antennas, or wish to deepen their understanding of VNA (Vector Network Analyzer) measurements. The session will delve into the fundamentals of vector network analysis, offer a step-by-step walkthrough of a simple calibration process, and provide a demonstration of antenna measurement.

Register now and learn more about the fundamentals of VNA measurements, S-parameters, voltage standing wave ratio (VSWR) and return loss, the importance of calibration in network analyzer measurements and more.


What is design verification testing?

Verification of a device means checking that the performance of the device matches the expectations both during development and once development is complete. These expectations can be set internally by the organization commissioning the device, or externally by standards also available to other device developers.
For signal processing devices, the increasing complexity and speed of the device, and the reductions in signal levels together make verification ever more complex. Verification involves ensuring that signal values and parameters always remain within acceptable limits under a wide range of conditions.

What is electronics testing?

Electronics testing means checking that a circuit using semi-conductors is performing correctly. While electronics testing includes fundamental properties such as voltage, current, resistance, conductance and capacitance, almost certainly the properties of the signals transmitted by the circuit will be the major reason for testing. Measurements on signal integrity (quality) such as noise or distortion, or out of the stipulated frequency band do not require demodulation. If the data transmitted by the signal shall be tested to check whether the content is correct, demodulation functions for the appropriate data communication standard are required. The expected results of electronic testing depend on the stage in the life cycle of the device under test (DUT). During development, accurate measurements resulting in values to check against the specification are required. During production, high speed testing with a pass/fail result will meet the test requirements.

What is electronic testing used to test?

So long as “electronic” is taken to mean any circuit using semi-conductors to manipulate electrons, “electronic testing” is used to test any properties of the circuit that can be measured; almost entirely electrical properties, which can be measured at various levels. At the fundamental level, properties such as voltage, current, resistance, conductance and capacitance, can be measured using a multimeter. At the higher level of the signals transmitted by the circuit, measurements on signal integrity (quality) such as noise or distortion, or out of the stipulated frequency band, are measured with respect to frequency using signal and spectrum analysis, and with respect to time with oscilloscope functions. If the data transmitted by the signal shall be tested to check whether the content is correct, demodulation functions for the appropriate data communication standard are required.

What is signal and power integrity?

In electronics, integrity is whether the expected performance and characteristics of the signal processing from input signal to output signal are being met. Signal integrity refers to the quality of the signal, whether the signal waveform is as anticipated, and the degree to which the waveform is deformed by noise, jitter, and distortion. Power integrity refers to whether the anticipated voltage and current levels are present at all times at the selected test location in the circuit, and parameters such as unplanned variations in level, and planned speed of change in level. Integrity is inevitably associated with testing, as the degree of integrity can only demonstrated by taking measurements and comparing the results to the specification. Poor signal or power integrity results in reduced performance and data transmission errors.

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