Signal model based approach to joint jitter and noise decomposition - First published at DesignCon 2020 - White Paper

How to create your first remote control application

Selecting your next oscilloscope: Why fast update rate matters - White Paper Brochures and Data Sheets White Paper

Selecting your next oscilloscope: Why digital triggering matters - White Paper Brochures and Data Sheets White Paper

Selecting your next oscilloscope: Why deep memory matters - White Paper Brochures and Data Sheets White Paper

This application note expands modulation bandwidth up to 2 GHz and covers both V- and E-band examples.

18-Jun-2015 | AN-No. 1MA257

Explore particle acceleration solutions from test and measurement experts. Trust our industry-leading equipment to meet particle accelerator test requirements.

Visit Rohde & Schwarz at the EMV 2025 in Cologne for all EMC test soltuions and much more.

This document provides the technical specifications of the R&S®RT-Zxx high voltage and current probes.

This application note explains how to convert different Rohde&Schwarz I/Q file formats among each other using the supplied software tool.

23-Sep-2015 | AN-No. 1EF85

From designing a test setup to performing accurate measurements

This application note discusses important aspects of double-pulse test setups as well as how to perform accurate measurements. Double-Pulse testing is a standard test-method.

22-Mar-2021 | AN-No. GFM347

Verify the energy efficiency of your O-RAN radio units

19-Mar-2024

This application note shows developers and manufacturers of devices with LoRa wireless technology how transmitter measurements are conducted in line with FCC Part 15.247.

29-Nov-2017 | AN-No. 1MA295

Spolupráce s univerzitami v plném proudu – kariérní dny, ISSE 2024, E-Camp a nové přístroje pro ZČU v Plzni přinášejí nové příležitosti.

Rohde & Schwarz offers test and measurements solutions for verifying the standard compliance of RF power amplifiers.

Oscilloscopes for debugging automotive Ethernet networks - Application Brochure

Measure the key performance criteria of your Sigfox device with comprehensive test solutions from Rohde & Schwarz. Read more to be ahead.

Measure the key performance criteria of your LoRa devices and gateways with best-in-class test solutions from Rohde & Schwarz. Read more to be ahead.

Perform interface tests during your USB design process and verify the compliance with USB test solutions from Rohde & Schwarz > Get more information!

We are celebrating 10 years of Rohde & Schwarz oscilloscope innovation and measurement confidence. Celebrate with us and win 1 of 10 R&S®RTB2000 oscilloscopes. Find out more.

R&S VSE-K106/FSx-K106/FPS-K106 EUTRA/LTE NB-IoT Measurement Application - Specifications

This Application Note addresses signal measurements and analysis of automotive radars that are crucial during the development and verification stages.

10-Jun-2016 | AN-No. 1MA267

Comprehensive testing of DOCSIS 3.1 cable modems, CMTS, network amplifiers and components

This guide covers the most important aspects of selecting an oscilloscope and provides you with the knowledge to make the best choice for your needs.

The R&S®RT-ZM modular probe system addresses current probing requirements with a technologically sophisticated yet easy-to-use solution.

Oscilloscope innovation. Measurement confidence. - Poster

Discover Rohde & Schwarz solutions for automotive Ethernet testing: world's first compliance test solution for 1000BASE-T1.

Rohde & Schwarz recognizes the potential risk of computer virus infection when con-necting Windows®-based test instrumenta-tion to other computers via local area net-works (LANs), or using removable storage devices.

27-Jan-2015 | AN-No. 1DC01

The application note guides developers and manufactures of Sigfox Devices to perform the required and recommended measurements with test solutions from Rohde & Schwarz.

15-Nov-2017 | AN-No. 1MA294

Topics include EMI pre-compliance measurements, conducted immunity testing, including EUT monitoring, and an introduction to the concept of performing uncertainty calculations specifically for EMC measurements.