Achieving accurate and repeatable D-Band on-wafer measurements

As multi gigabit digital communication systems push into ever higher frequencies, test engineers need to extend the limits of on wafer S parameter measurements to accurately model and characterize devices. This presentation covers best practices for achieving accurate, stable, and repeatable D band on wafer S parameter measurements using a Rohde & Schwarz ZNA with 170 GHz frequency extenders. We’ll take you inside the FormFactor labs in Dresden, Germany, for a live demonstration and highlight the critical measurement decisions along the way.