1MA177: LTE Terminal Tests under Fading Conditions with R&S®CMW500 and R&S®AMU200A

This application note shows how to perform LTE terminal block error rate (BLER) and throughput tests under fading conditions with the R&S®CMW500 Protocol Tester and the R&S®AMU200A Fading Simulator.

Name Type Language Version Date Size
1MA177_4e_LTE_terminal_tests_under_fading_cond.pdf Application Note English 4e 06.06.2011 1 MB
International Website