R&S®FSPN Phase noise analyzer and VCO tester

Unrivaled sensitivity meets high speed

R&S®FSPN Phase noise analyzer and VCO tester, Front Low

Key facts

Pure phase noise analyzer and VCO tester with high measurement speed due to hardware-implemented real-time cross-correlation
Very high sensitivity for phase noise measurements thanks to dual synthesizers and cross-correlation included in the base unit, typ. –163 dBc (1 Hz) at 1 GHz carrier frequency and 10 kHz offset
Frequency range from 1 MHz to 26.5 GHz
Extremely low‑noise internal DC sources for automatic VCO characterization
Simultaneous measurement of phase noise and amplitude noise

Increased efficiency and reproducibility of phase noise measurements from lab to production

The R&S®FSPN phase noise analyzer and VCO tester is designed to provide both very high sensitivity and measurement speed for production and design engineers working in these fields characterizing sources such as synthesizers, VCOs, OCXOs, and DROs. It is the ideal instrument for demanding development and production phase noise and VCO analysis.
Equipped with two low phase noise synthesizers and a real-time cross correlation engine for increased measurement sensitivity, just a few correlations are needed to measure very high-quality oscillators, synthesizers or VCOs in production. Increase the number of correlations to characterize the most sensitive commercially available synthesizers and oscillators in R&D.

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Features & benefits

Measurement speed taken to its limit

Speed up the development of your device

Signal sources can be developed and optimized faster using an instrument that delivers results in a short measurement time. The R&S®FSPN takes just a few seconds to display the phase noise trace of high-end sources like OCXOs or DROs.

**Phase noise analysis on the R&S®FSPN**

Phase noise measurements with highest sensitivity

Real-time cross-correlation for improved phase noise sensitivity

The R&S®FSPN base unit includes cross-correlation functionality to measure sources that have very low phase noise, even lower than the phase noise of the internal high-end sources. The improvement that can be expected when using this functionality is as follows:

ΔL = 5 · log(n), where

ΔL: improvement in phase noise sensitivity in dB,
n: number of cross-correlations

Using the R&S®FSPN, just a few correlations are needed to measure a very good quality oscillator. This shortens measurement time which is essential in production environments. As an example, increasing the number of correlations by a factor of 10 lowers the inherent phase noise of the R&S®FSPN by 5 dB.

**Simultaneous measurement of phase noise and amplitude noise** - The R&S®FSPN measures phase noise and amplitude modulation in parallel and shows the current cross correlation sensitivity gain indicated by the gray area.

Fastest VCO characterization

Thanks to its extremely low-noise internal DC sources, the R&S®FSPN can measure the phase noise of voltage-controlled oscillators (VCO) at various tuning and supply voltages. VCO characterization varying the tuning voltage or the supply voltage can be completed extremely fast. The following parameters are delivered instantaneously:

Frequency versus voltage
Tuning slope versus voltage
Output power versus voltage
Current drain versus voltage
Output power versus frequency

Transient response analysis

Up to 8 GHz wideband analysis for frequency and phase measurements in time domain

The R&S®FSPN offers up to 8 GHz bandwidth for detailed characterization of synthesizers, measuring the settling times after a frequency hop, ramps, switching times etc. For narrowband characterization, the R&S®FSPN offers narrowband analysis down to 40 MHz, e.g. to analyze the transient response of PLLs in detail.
The display offers a persistence mode of all traces, which makes it easy to estimate how strongly the parameters scatter or whether there are any outliers.

**Transient analysis with settling time measurement**

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Related videos

1:24

The R&S®FSPN – unrivalled sensitivity meets high speed

Next generation technologies like radar and satellite communication with high data rates call for innovative testing solutions to develop and manufacture RF components. With the launch of the R&S®FSPN, Rohde & Schwarz is adding a new member to the phase noise analyzer portfolio, enabling increased efficiency and reproducibility of phase noise measurements and VCO characterization from lab to production. Watch the video and find out more!

29-Sep-2021

More about phase noise measurements

White paper: Understanding phase noise measurement techniques

Learn more about how different instruments measure phase noise.

More information

White paper: Understanding phase noise fundamentals

This white paper provides a brief technical introduction to phase noise concepts as well as an overview of how phase noise is measured and reported.

More information

White paper: Understanding voltage controlled oscillators

Download this white paper and learn more about voltage controlled oscillators and measurements made during the VCO characterization process.

More information

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General and legal information

Manufacturer's recommended retail price (MSRP). The price shown does not include VAT. Prices and offers are only intended for entrepreneurs and not for private end consumers.

Terms & Conditions of the Prize Draw 10 years Rohde & Schwarz oscilloscopes

1. The prize draw “10 years Rohde & Schwarz oscilloscopes” (herein referred to as “Draw”) is organized by Rohde & Schwarz GmbH & Co. KG, Mühldorfstraße 15, 81671 Munich, Germany, Tel. +49 89 41 29 0 (herein referred to as “R&S).

2. All participators can register to the draw during January 01, 2020 to December 31, 2020 with their name, company name and business e-mail.

3. Participation is free of charge and not dependent on the purchase of goods or services.

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5. The prizes to win are 1 of 10 R&S®RTB2000 within the time frame January 1, 2020 to December 31, 2020:

Prize: 1x R&S®RTB2000 Digital Oscilloscope

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R&S®FSPN Phase noise analyzer and VCO tester

Unrivaled sensitivity meets high speed

Increased efficiency and reproducibility of phase noise measurements from lab to production