- 2 Gsample/s realtime sampling rate, low-noise flash A/D converter
- 2 Mpoint memory, zoom up to 50 000:1
- MSO functionality included as standard (HO3508 logic probe with eight channels required)
- Component tester for capacitors, inductors and semiconductors
- Vertical sensitivity down to 1 mV/div
- Trigger modes: slope (A/B), pulse width, video, logic, serial buses (optional)
- Serial bus trigger and hardware-accelerated decode including list view options: I2C + SPI + UART/RS-232 (HOO10/HOO11), CAN + LIN (HOO12)
- 28 automeasurement parameters plus statistics, formula editor, ratio cursor
- Six-digit hardware counter
- FFT up to 64 kpoints (dBm, dBV, V (RMS))
- Pass/fail test based on masks
- Automatic search for user-defined events
- Display: 12-div x-axis, 20-div y-axis (VirtualScreen)
- 2 x USB for mass storage, RS-232/USB dual interface for remote control
Key facts
- 2 Gsample/s realtime sampling rate, low-noise flash A/D converter
- 2 Mpoint memory, zoom up to 50 000:1
- MSO functionality included as standard (HO3508 logic probe with eight channels required)
- Component tester for capacitors, inductors and semiconductors
- Vertical sensitivity down to 1 mV/div
- Trigger modes: slope (A/B), pulse width, video, logic, serial buses (optional)
- Serial bus trigger and hardware-accelerated decode including list view options: I2C + SPI + UART/RS-232 (HOO10/HOO11), CAN + LIN (HOO12)
- 28 automeasurement parameters plus statistics, formula editor, ratio cursor
- Six-digit hardware counter
- FFT up to 64 kpoints (dBm, dBV, V (RMS))
- Pass/fail test based on masks
- Automatic search for user-defined events
- Display: 12-div x-axis, 20-div y-axis (VirtualScreen)
- 2 x USB for mass storage, RS-232/USB dual interface for remote control