Designers of electronic products need to comply with EMC regulations. Usually, considering some rules during the design process, problems are reduced but this is not a common practice because time, cost, and metallization limitations so the problems appear during the manufacturing or marketing phase of the product creating situations of stress, cost overruns or even leading to the failure of the project.
EMI debugging including localizing intermittent failures can be frustrating without an appropriate strategy.
This presentation covers the fundamentals for troubleshooting an electronic design with electromagnetic interferences (EMI), or Electromagnetic Compatibility (EMC) problems using state of the art oscilloscopes to analyze your signals in both the time and frequency domains. The use of voltage, current, and near-field probes, LISN, and antennas, will be reviewed combined with some tips for best practice with the latest generation of oscilloscopes.