R&S solution for PCIe reference clock testing
With
R&S®FSWP
and
R&S®FSPN
, Rohde & Schwarz provides industry leading phase noise analyzers for accurate and fast jitter measurements of PCIe RefClks. An external PC-based software is available to remote-control these instruments and automatically apply the postprocessing according to the PCI Express Base Specification.
The solution features:
- High-performance cross-correlation architecture reduces the internal phase noise of the instrument
- Industry-leading phase-noise and jitter performance minimizes the required number of cross-correlations and thus also the test time for a given DUT.
- Modern digital demodulation concept allows the analysis of RefClks with SSC and the separation between phase and amplitude noise.
- Comfortable postprocessing according to the PCIe Base Specification is possible with the external, PC-based software, which is provided free of charge and provides jitter results for all defined combinations of behavioral transfer functions (Tx PLL, Rx PLL and CDR) and marks the combination with the highest jitter result.
- Additive phase noise measurement option to test the jitter performance of the clock tree components that buffer, fan-out, divide or multiplex the RefClk.
- Spectrum analyzer option that turns the R&S®FSWP into a high-end spectrum analyzer, e.g., to measure spurs.
Using the
R&S®SMA100B
as a signal source adds further test capabilities by:
• Stimulating the DUT with a quasi-ideal SSC RefClk: This is required for clock tree component testing and silicon validation to determine the true electrical performance of the tested PCIe interface.
• Injecting sinusoidal jitter to measure the
jitter attenuation or jitter transfer function (JTF)
. Typical use cases are measurements of jitter attenuators and add-in card PLL bandwidth tests.
Discuss your PCIe reference clock testing needs with our experts.