This webinar by MPI Corporation and Rohde & Schwarz presents how MPI’s RF probe station integrates with the R&S®ZNA vector network analyzer to deliver high-quality on-wafer RF measurements. The session is aimed at engineers and lab managers who need reliable wafer-level characterization—for example in RF IC development, process monitoring, or design validation—where stable probing, calibrated setups, and trustworthy VNA data are essential.
The session explains why combining a precision RF probe station with a modern VNA matters for everyday characterization workflows: from setup repeatability and measurement integrity through to practical considerations for on-wafer S-parameter and related RF measurements. You gain a clear picture of how the MPI probing environment and the R&S®ZNA work together as a coherent measurement chain, and how it supports confidence in results, workflow efficiency, and scaling characterization from the lab to production-oriented test needs.
Duration: 60 minutes. Audience: RF, test, and characterization professionals in semiconductor and related industries.
