16 Resultados
This document provides the technical specifications of the R&S®FSWP phase noise analyzer and VCO tester.
The R&S®FSWP phase noise analyzer is a highend instrument designed to accurately analyze noise performance of key components in radar and communications systems. Using phase noise measurements, a device’s large-signal noise figure can be derived under real-world operating conditions.
This document provides the technical specifications of the R&S®FSWP phase noise analyzer and VCO tester.
The R&S®FSWP phase noise analyzer and VCO tester features very high sensitivity thanks to extremely low-noise internal sources and cross-correlation. It can measure phase noise on highly stable sources such as those found in radar applications in just seconds. Additional options such as pulsed signal measurements, residual phase noise (including pulsed) characterization and integrated high-end signal and spectrum analysis make the R&S®FSWP a unique test instrument. A multitouch display ensures straightforward and intuitive operation.
Enhanced Specifications for AM/FM/φM Modulation Analysis
R&S®FSWP (Facelift) Phase Noise Analyzer and VCO Tester | 相位噪声分析仪和VCO测试仪 - Product Brochure Folhetos e folhas de dados Product brochure
This document provides the technical specifications of the pulse measurement application – R&S®FSW/FSWP/FSMR3/FSV3/FSV/FPS/VSE-K6, R&S®FSWP-K6P, R&S®FSW/FSWP-K6S, R&S®VSE-K6A
Technical specifications of the noise figure measurement options: R&S®FSW-K30, R&S®FSWP-K30, R&S®FSMR3-K30, R&S®FSV3-K30, R&S®FPS-K30, R&S®FSV-K30, R&S®FPL1-K30.
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Rohde & Schwarz signal and spectrum analyzers equipped with the R&S®FSx-K30 option form the basis of a solution to accurately measure the noise figure in the millimeterwave frequency range using the Y-factor method.
This document provides the technical specifications of the R&S®VSE-K60/R&S®FSx-K60 transient measurement application, the R&S®VSE-K60C/R&S®FSx-K60C transient chirp measurements, the R&S®VSE-K60H/R&S®FSx-K60H transient hop measurements and the R&S®FSx-K60P transient phase noise measurements.
This document provides the technical specifications of the R&S®FSx-K50 spurious measurement application.
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This document provides the technical specifications of the R&S®VSE-K70x/FSx-K70x/FPx-K70x vector signal analysis application.