Téléchargements

Enhance frequency translating measurements

English - 9 févr. 2026

Automated internal/external cable and connector test ­solution in line with PCIe 5.0 and 6.0 specifications

English - 22 déc. 2025

Full RF component characterization using a single RF connection.

English - 10 nov. 2025

Ensures compliance of high speed Ethernet cable assemblies with fast automation and easy testing.

English - 5 oct. 2025

Differential RF on-wafer measurements up to 110 GHz on MPI probe stations

English - 14 août 2025

Three-port on-wafer mixer measurements up to the THz range on MPI probe stations

English - 14 août 2025

The R&S®ZNA vector network analyzer enables high-power amplifier testing under real operating conditions.

English - 14 juil. 2025

Receiver and LNB characterization

English - 12 juin 2025

Transmit/receive module and AESA radar testing

English - 12 juin 2025

mmWave measurements: The R&S®ZVA-Zxxx and R&S®ZCxxx mmWave converters extend the R&S®ZNA vector network analyzer frequency range up to 1.1 THz.

English - 27 févr. 2025

A Fabry-Pérot open resonator (FPOR) provided by QWED allows dielectric sheets to be accurately characterized in the frequency range from 110 GHz to 170 GHz using just one fixture.

English - 14 janv. 2025

On-wafer characterization at sub-THz frequencies

English - 12 déc. 2023

Get insights into small cell testing aspects throughout the product life cycle with particular focus on production test solutions for FR2.

English - 19 juin 2023

Generating models with a VNA and using these on an oscilloscope via the deembedding

English - 22 mai 2023

The R&S®ZNA vector network analyzer with integrated LO output and direct IF input options is a simple, cost-effective solution for 2-port and 4-port measurements using Rohde & Schwarz mmWave converters.

English - 27 avr. 2023

Maximizing power amplifier efficiency with harmonic load pull measurements

English - 17 avr. 2023

This application note provides practical hints to accurately characterize and de-embed these lead-in and lead-out structures with R&S Vector Network Analyzers ZNA, ZNB, ZNBT and ZND.

English - 19 sept. 2022

Early wafer-level qualification of RF components ensures quality and saves money

English - 14 juil. 2022

With continuously increasing data rates, signal integrity in high speed digital designs becomes more and more demanding

English - 8 juil. 2022

RF system noise contributions define receiver capabilities and sensitivity. The noise figure measures how the critical components affect the signal.

English - 28 janv. 2022

Noise figure is an important parameter that describes the noise contribution of an electronic device. A classical approach to measure the noise figure is to use a noise source which delivers two different input noise powers by switching between a “hot” and a “cold” state and a noise receiver

English - 23 déc. 2021

The R&S®ZNA vector network analyzer with integrated LO output and direct IF input options is a simple, cost-effective solution for 2-port and 4-port measurements using Rohde & Schwarz mmWave converters.

English - 19 juil. 2021

With high precision, an intuitive user interface and uncertainty bands provided directly on the screen, the R&S®ZNA takes accuracy to a new level.

English - 19 juil. 2021

This application note describes Methods of Implementations (MOI) for precise, fast and error-free compliance testing of high-speed backplanes.

English - 7 avr. 2021

This application note describes Methods of Implementations (MOI) for precise, fast and error-free compliance testing of high-speed backplanes and direct attach copper cables (DAC).

English - 7 avr. 2021

This paper investigates the evaluation complexities and importantce of PAM-4 interconnects at high data rates.

English - 22 oct. 2020

Load pull is a powerful method to characterize RF power amplifiers and enablse model extraction and validation and performance, ruggedness and efficiency testing.

English - 2 sept. 2020

Vector Network Analyzers of t ZNA and ZNB family are able to measure magnitude and phase of complex S-parameters of a device under test (DUT) in the frequency domain.

English - 30 juil. 2020

This application note shows how to measure the phase accurately between several signals using vector network analyzers of the R&S®ZNA, R&S®ZNB and R&S®ZNBT families.

English - 11 juil. 2019