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범주 및 주제별로 분류된 전체 동영상 개요 페이지 목록. 특정한 적용 사례나 측정 기법에 대해 자세히 알아보고자 하십니까? 관심 분야를 선택하십시오.

Ethernet communications has been introduced in automotive networks to enable fast and cost efficient data communications.

3월 27, 2015

Differential measurements with Spectrum Analyzers and Probes

6월 28, 2013 | AN-번호 1EF84

이 애플리케이션 노트는 Mireacast 무선 비디오 송신 시스템의 구성과 지연 시간 측정 방법에 대해 설명합니다.

10월 01, 2015 | AN-번호 1MA250

이 애플리케이션 카드를 읽고 10BASE-T1S 이더넷 컴플라이언스 테스트가 무엇을 제공하며 신뢰할 수 있는 작동과 기능을 어떻게 보장하는지에 대해 자세히 알아보십시오.

5월 15, 2020

Jun 21, 2023 | 보도 자료 | Test & measurement

Rohde & Schwarz and Zurich Instruments will present advanced test and measurement solutions for photonics at the LASER World of PHOTONICS tradeshow in Munich. Highlighted solutions include the R&S FSPN and R&S FSWP, two exceptionally powerful phase noise analyzers for characterizing laser systems. Visitors can also see demos of the R&S MXO 4 and R&S RTO6 oscilloscopes from Rohde & Schwarz as well as the Quantum Computing Control System (QCCS) and lock-in amplifiers from Zurich Instruments.

This document provides the technical specifications of the R&S®FSW3-KM107/R&S®Fxx-K7/ESW-K7/VSE-K7/RTO AM/FM/PM modulation analysis option.

Video Overview for RTO6 product videos.

RTO2000 제품 관련 동영상 개요.

이 애플리케이션 노트는 테스트 절차와 능동 위상 배열 안테나의 관련 파라미터 특성분석에 대해 설명합니다.

7월 04, 2016 | AN-번호 1MA248

Mar 04, 2025 | 보도 자료 | Wireless communications

To showcase the potential of network energy saving (NES) in open radio access networks (O-RAN), Rohde & Schwarz and VIAVI Solutions have collaborated with Analog Devices. At Mobile World Congress 2025 in Barcelona, visitors can experience the joint O-RU test solution of the two T&M companies as it verifies the low power consumption of Analog Devices’ new Titan O-RU platform according to ETSI specifications. These network energy saving tests help to significantly reduce energy consumption and OPEX in O-RAN integrations.

이 애플리케이션 노트에서는 VOR(VHF Omnidirectional Radio Range), GS(Glide Slope) 및 LLZ(Localizer)를 위한 ILS(Instrument Landing System), MB(Marker Beacon) 등의 다양한 항공 무선 항행 신호에 대해 자세히 다룹니다.

2월 01, 2012 | AN-번호 1MA193

R&S®RT-Zxx Oscilloscope Adapters - Specifications

Assisting Tools for Operation of Windows-Based T&M Instruments

6월 13, 2013 | AN-번호 1MA218

Models: R&S®RTO-K26, R&S®RTO6-K26, R&S®RTP-K26, R&S®RTO-K27, R&S®RTO6-K27, R&S®RTP-K27

This application note introduces the IVI High Speed LAN Instrument Protocol (HiSLIP) and outlines its features. HiSLIP is the successor to the VXI-11 LAN remote control protocol. This document also describes guidelines for using this protocol.

11월 12, 2014 | AN-번호 1MA208

Models: R&S®RTO-K92, R&S®RTO6-K92

Models: R&S®RTO-K87, R&S®RTP-K87, R&S®RTO6-K87

Models: R&S®RTP-K89, R&S®RTO-K89, R&S®RTO6-K89

Models: R&S®RTO-K88, R&S®RTP-K88, R&S®RTO6-K88

Models: R&S®RTP-K25, R&S®RTO-K25, R&S®RTO6-K23

Models: R&S®RTO-K24, R&S®RTP-K24, R&S®RTO6-K24

Models: R&S®RTO-K86, R&S®RTP-K86, R&S®RTO6-K22

Models: R&S®RTP-K81, R&S®RTO-K81, R&S®RTO6-K81, R&S®RTP-K83

R&S RT-Zxx High Bandwidth Probes - Specifications

Jun 11, 2024 | 보도 자료 | Test & measurement

Rohde & Schwarz has developed the R&S RT-ZISO isolated probing system for extremely accurate measurements of fast switching signals, especially in environments with high common-mode voltages and currents.

May 27, 2024 | 보도 자료 | Test & measurement

Rohde & Schwarz will showcase its latest solutions for power electronics testing at PCIM Europe in Nuremberg, addressing challenges of testing and debugging the next generation of wide bandgap semiconductors in power electronic converters.

Jun 06, 2023 | 보도 자료 | Test & measurement

At Automotive Testing Expo Europe 2023 in Stuttgart, Rohde & Schwarz will demonstrate a wide range of cutting-edge test solutions that support automotive applications. With test solutions on show that cover automotive radar, Ethernet, 5G and UWB, the company enables the automotive industry to make the next level of autonomous driving reality.

Oct 01, 2024 | 보도 자료 | Test & measurement

Rohde & Schwarz exhibits advanced T&M solutions that address emerging challenges in consumer electronics development at CETEX Consumer Electronics Test & Development Forum and Expo at RAI in Amsterdam.