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Power integrity measurements with R&S®RTM3000 and R&S®RTA4000 oscilloscopes

Combining a low-noise oscilloscope with a power rail probe provides a measurement system that delivers measurements that are more accurate.

Englisch - 03.01.2018

Accurate and fast power integrity measurements

Increasing demands on power distribution networks have resulted in smaller DC rails, as well as a proliferation of rails that ensure clean power reaches the pins of integrated circuits.

Englisch - 07.03.2017

Scope Days 2023_Day 2_am_R&S_POWER INTEGRITY AND HOW IT AFFECTS SIGNAL INTEGRITY_en

Englisch - 19.04.2023

3 MB | PDF

Verifying power integrity for DDR memories

Verifying power integrity for DDR memories - The R&S ® RT-ZPR20 power rail probe is a specialized oscilloscope probe for very low-noise measurements on power.

Englisch - 05.04.2017

Power integrity webinar slides

Power integrity: Challenges, best practices and test solutions for sensitive electronic designs.

Englisch - 08.07.2019

6 MB | PDF

RSTW - Measuring power integrity with the R&S®RTM3000 and R&S®RTA4000

Englisch - 01.01.1970

444 kB | PDF

Power integrity measurements with R&S®RTM3000 and R&S®RTA4000 oscilloscopes

Combining a low-noise oscilloscope with a power rail probe, developed uniquely for measuring power rails, provides a measurement system that delivers measurements that are more accurate.

Englisch - 09.07.2020

Power integrity measurements with R&S®RTP oscilloscopes

The R&S®RT-ZPR20 and R&S®RT-ZPR40 power rail probes with a 1:1 attenuation ratio have very little noise and sufficient bandwidth to not attenuate critical signal content.

Englisch - 17.07.2018

Efficient analysis of power and signal integrity and EMC - Flyer

Englisch - 05.07.2017

17 MB | PDF

RSTW - Measure quickly and accurately 5 Techniques for Power Integrity

Englisch - 01.01.1970

852 kB | PDF

R&S®RT-ZPR20 Accurate and fast power integrity measurements - Application Card

R&S RT-ZPR20 Accurate and fast power integrity measurements - Application Card

Englisch - 01.03.2017

3 MB | PDF

R&S®RT-ZPR20 Verifying power integrity for DDR memories - Application Card

R&S RT-ZPR20 Verifying power integrity for DDR memories - Application Card

Englisch - 11.05.2017

3 MB | PDF

Measuring power supply induced jitter and PSNR in low jitter oscillators and clocks

Measuring the power supply noise rejection (PSNR) requires accurate generation and leveling of artificial, sinusoidal disturbances and measurement of resulting phase-noise and jitter impairments.

Englisch - 30.09.2020

Common mode distortion of wide-bandgap power electronics probing

Englisch - 25.11.2024

Rohde & Schwarz France: Power integrity and its impact on signal integrity - Article

Article en français L'intégrité de puissance et son impact sur l'intégrité du signal

Englisch - 10.04.2018

391 kB | PDF

R&S®RTA4000 Oscilloscope - Product Brochure

R&S RTA4000 Oscilloscope - Product Brochure

Englisch - 07.06.2023

10 MB | PDF

R&S®RTA4000 Oszilloskop - Produktbroschüre DE

R&S RTA4000 Oscilloscope - Product Brochure

Deutsch - 08.10.2020

6 MB | PDF

Analyzing power designs for high-speed SoCs with multiphase buck converters

Englisch - 13.01.2025

Probes and accessories | For Rohde & Schwarz oscilloscopes - Product Brochure

Englisch - 18.12.2025

13 MB | PDF

R&S®RTA4000 versus Keysight 4000 X-Series - Fact Sheet

RTA4000 versus Keysight 4000 X-Series - Fact Sheet

Englisch - 31.10.2019

507 kB | PDF

System Level Verification and Debug of DDR3/4 Memory Designs

This application note provides an introduction to the DDR memory technology and explains common challenges, related to the specific nature of DDR data, command and control buses.

Englisch - 30.10.2020

Automotive solution Domain controller and high-perfomance CPUs - Flyer

Automotive text solution domain controllers and high-performance CPUs, Automotive Ethernet, PCIe, DDR/LPDDR, SERDES, MIPI, Power/signal integrity, EMI debugging

Englisch - 27.11.2020

2 MB | PDF

Electronic design and test days - Agenda 2020

This Electronic Design and Test Day offers researchers, developers, manufacturers and test equipment users an excellent opportunity to discuss technical and implementation challenges as well as best practices related to DC/DC converter design, digital design & test, power and signal integrity, and EMI debugging.

Englisch - 01.01.1970

264 kB | PDF

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