Dokumente & Artikel suchen

Signal integrity analysis for high speed datacom interfaces

The R&S®RTP and R&S®RTO oscilloscopes are capable of characterizing high speed datacom interfaces and performing in-depth signal integrity analysis.

Englisch - 15.07.2024

DisplayPort: Compliance and Signal Integrity Debugging

Englisch - 16.07.2025

Verify high frequency signal integrity on printed circuit boards

The R&S®ZNB measures the signal integrity on the PCB, taking the needed test fixtures and probes into consideration – a complete solution in a compact format.

Englisch - 25.03.2020

Efficient analysis of power and signal integrity and EMC - Flyer

Englisch - 05.07.2017

17 MB | PDF

Scope Days 2023_Day 2_am_R&S_POWER INTEGRITY AND HOW IT AFFECTS SIGNAL INTEGRITY_en

Englisch - 19.04.2023

3 MB | PDF

Rohde & Schwarz France: Power integrity and its impact on signal integrity - Article

Article en français L'intégrité de puissance et son impact sur l'intégrité du signal

Englisch - 10.04.2018

391 kB | PDF

Conformance Test failed. What now? - Reprint

Englisch - 28.04.2022

3 MB | PDF

R&S®RTA4000 Oscilloscope - Product Brochure

R&S RTA4000 Oscilloscope - Product Brochure

Englisch - 07.06.2023

10 MB | PDF

R&S®RTA4000 Oszilloskop - Produktbroschüre DE

R&S RTA4000 Oscilloscope - Product Brochure

Deutsch - 08.10.2020

6 MB | PDF

R&S®EMC32 EUT Monitoring with R&S®Digital Oscilloscopes

This application note describes how to use the R&S®RTO, R&S®RTE and R&S®RTM Digital Oscilloscopes for EUT monitoring of signal forms.

Englisch - 20.04.2015

Probes and accessories | For Rohde & Schwarz oscilloscopes - Product Brochure

Englisch - 18.12.2025

13 MB | PDF

Power integrity measurements with R&S®RTP oscilloscopes

The R&S®RT-ZPR20 and R&S®RT-ZPR40 power rail probes with a 1:1 attenuation ratio have very little noise and sufficient bandwidth to not attenuate critical signal content.

Englisch - 17.07.2018

DDR5/LPDDR5 Interfaces | Oscilloscope test software for systems with DDR5 or LPDDR5 DRAM memories - Application Brochure

Signal integrity verification and compliance test - Application Brochure

Englisch - 17.11.2025

3 MB | PDF

Testing insertion loss of PCB signal structures with Delta‑L 4.0

With continuously increasing data rates, signal integrity in high speed digital designs becomes more and more demanding

Englisch - 08.07.2022

Triggering read and write cycles of DDR3 memories

The digital trigger of the R&S®RTP combined with the zone trigger offers versatile and flexible triggering capabilities for DDR memory interface measurements.

Englisch - 26.09.2018

R&S®RTA4000 versus Keysight 4000 X-Series - Fact Sheet

RTA4000 versus Keysight 4000 X-Series - Fact Sheet

Englisch - 31.10.2019

507 kB | PDF

Common mode distortion of wide-bandgap power electronics probing

Englisch - 25.11.2024

Verifying power integrity for DDR memories

Verifying power integrity for DDR memories - The R&S ® RT-ZPR20 power rail probe is a specialized oscilloscope probe for very low-noise measurements on power.

Englisch - 05.04.2017

RSMY High Speed Solutions for AI Challenges Agenda

Englisch - 30.04.2025

395 kB | PDF

System Level Verification and Debug of DDR3/4 Memory Designs

This application note provides an introduction to the DDR memory technology and explains common challenges, related to the specific nature of DDR data, command and control buses.

Englisch - 30.10.2020

Zone trigger for DDR read/write separation

Debugging and verifying the DDR DRAM memory interface in a system design can be challenging. The R&S®RTP high-performance oscilloscope zone trigger is ideal for READ/WRITE separation as a basis for analyzing signal integrity.

Englisch - 06.02.2025

R&S®RT-ZPR20 Verifying power integrity for DDR memories - Application Card

R&S RT-ZPR20 Verifying power integrity for DDR memories - Application Card

Englisch - 11.05.2017

3 MB | PDF

Efficient eye diagram testing in DDR3/DDR4 system designs

For system verification and debugging, eye diagram measurements are the most important tools for efficiently analyzing the signal integrity in any digital design

Englisch - 19.02.2019

Know your jitter when debugging - White Paper

Englisch - 22.10.2021

5 MB | PDF

R&S®RTP High-Performance Oscilloscope - Product Brochure

Englisch - 08.12.2025

21 MB | PDF

Automotive solution Domain controller and high-perfomance CPUs - Flyer

Automotive text solution domain controllers and high-performance CPUs, Automotive Ethernet, PCIe, DDR/LPDDR, SERDES, MIPI, Power/signal integrity, EMI debugging

Englisch - 27.11.2020

2 MB | PDF

Deembedding Test Fixtures For High-Speed Digital Applications

Generating models with a VNA and using these on an oscilloscope via the deembedding

Englisch - 22.05.2023

Rapid Characterization of High Speed Digital Channels using a Multiport VNA

In this paper a rapid characterization of high speed digital channels using a multiport VNA is demonstrated.The VNA is a major tool in the field of communication and signal processing.

Englisch - 18.03.2020

Verify the performance of your high-speed digital design - Flyer

Englisch - 05.03.2018

1 MB | PDF

Measurements on special components (filter modules, combiners, etc.)

Learn how systematic testing of filter combiners and RF components ensures standards conformance, detecting defects for optimal base station performance

Englisch - 09.01.2025

Download-Center

Die Dokumente & Artikel von Rohde & Schwarz bieten vielfältiges Informationsmaterial.