From design to real RF device – connecting EDA simulation and hardware test

This webinar is intended for engineers who design RF components and systems using tools for simulation and hardware test. We will be introducing a new joint solution approach, developed in cooperation with Cadence. The R&S®VSESIM-VSS solution is enhancing the capabilities of the Cadence® Visual System Simulator™ (VSS), widely used to perform EDA simulation.

The new solution streamlines the development process of RF components and systems by allowing real signals to be used in EDA system simulation and hardware tests. Simulation with complex wideband signals according to latest 5G NR or Wi-Fi specifications allows more realistic results than before. Using the same signal creation methods and analysis algorithms as for subsequent hardware tests ensures a direct correlation from early design to implementation verification.

To make this possible, signal generation and analysis tools R&S®WinIQSIM2 and R&S®VSE have been integrated into Cadence’s VSS simulation tool. A demonstration of the upcoming R&S®VSESIM-VSS solution will illustrate how effectively and efficiently the new approach works and how you can benefit from it.


Markus Loerner is a marketing expert at Rohde & Schwarz focusing on the RF & microwave component market. He joined Rohde & Schwarz in 2000 and worked as a signal generator product manager in various RF applications from mobile wireless to satellite communications, for both R&D and production use. He holds a degree in electrical engineering from the University Erlangen-Nuremberg, Germany.

Markus Loerner

Dr. Gent Paparisto is a Product Engineering Architect at Cadence Design Systems. He holds a Ph.D. degree in electrical engineering from the University of Southern California (USC), Los Angeles. Dr. Paparisto has extensive experience in systems engineering, covering a broad range of communication technologies as well as signal processing algorithms for wireless and wireline applications. He has led and participated in the design and implementation of several products for cellular and wireless systems. He is also experienced in the RF system design and analysis field, and he has contributed extensively to the development of AWR RF simulation tools. Dr. Paparisto has authored multiple publications in international journals and conferences, served on the technical program committees of various IEEE conferences, contributed to the 3GPP TSC GERAN standardization effort, and is a US patent holder.