background

Part 1a: Test and Setup design challenges

Session a: Measurements of Currents and High voltages

Speaker: Nicholas LeBas from Rohde & Schwarz

Abstract:

  • How to adapt my test setups to wide bandgap materials like SiC or GaN?
  • Which dynamic range do I need?
  • Do I need an optical isolated Probe?

リクエスト情報

Do you have questions or need additional information? Simply fill out this form and we will get right back to you.
For service/support requests, please go here to log in or register.

マーケティング・パーミッション

お問い合わせ内容が送信されました。 後ほどご連絡致します。
An error is occurred, please try it again later.