R&S®SMW-K69 LTE Closed-Loop BS Test

Key Facts

  • Realtime HARQ feedback processing
  • Realtime UE timing adjustment
  • Binary or serial feedback mode
  • Block error insertion for feedback line

Brief Description

The R&S®SMW-K69 LTE closed-loop BS test option makes it possible to generate dynamically changing LTE test signals for HARQ feedback and UL timing adjustment tests.

Key Facts

  • Realtime HARQ feedback processing
  • Realtime UE timing adjustment
  • Binary or serial feedback mode
  • Block error insertion for feedback line

Brief Description

The R&S®SMW-K69 LTE closed-loop BS test option enables test engineers to generate dynamically changing LTE test signals as required, making it possible to perform HARQ feedback and uplink timing adjustment tests in line with the LTE base station conformance test specification 36.141 (chapter 8).

The R&S®SMW-K69 option adds the following to the R&S®SMW-K55 LTE option:

  • Realtime response of the simulated UE to HARQ feedback commands (ACK/NACK) from the base station (= eNB)
  • Realtime response of the simulated UE to timing adjustment commands from the base station (= eNB)

The R&S®SMW200A vector signal generator is a unique one-box solution for LTE closed-loop base station tests. The R&S®SMW200A combines multi-baseband signal generation, multipath fading and AWGN simulation, dual RF signal generation as well as realtime response to base station feedback for HARQ and uplink timing adjustment in a single instrument (additional options required).

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