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Provides the information required to prepare the instrument for use and start working.

Englisch - 16.12.2021

Describes all instrument functions and remote control commands, as well as measurement and programming examples.

Englisch - 27.01.2023

Deutsch - 25.09.2024

Provides information on security issues when working with R&S®RTE in secure areas.

Englisch - 25.07.2021

The R&S®RTO / R&S®RTE oscilloscope is a valuable tool for analyzing EMI problems in electronic designs. High input sensitivity, high dynamic range and a powerful FFT implementation are key features for capturing and analyzing unwanted emissions.

Englisch - 26.02.2015

Deutsch - 23.02.2026

Englisch - 25.09.2024

Englisch - 23.02.2026

With the R&S®RTO-K17/RTE-K17 High Definition Option the user will see more signal details with up to 16 bit vertical resolution.In combination with the superior analog front end of the R&S®RTO and R&S®RTE, the user has a versatile instrument in his hands to analyze a wide range of applications. From Switch Mode Power Supplies to Radar RF, the user can inspect all with one scope.

Englisch - 13.04.2015

The numerous supply voltages of FPGAs, CPUs and DSPs need to be powered-up in a specific order to ensure reliable operation. It is crucial to verify this power sequencing during circuit design and product development.

Englisch - 08.10.2018

LLC resonant converters achieve very high efficiency levels due to soft switching. However, during the power-on phase such a converter might behave differently until the controller has reached a steady state. Measuring the inrush current and the power-on time ensures that they are within standards and comply with the data sheet.

Englisch - 29.11.2018

This application note offers a straightforward description of how to analyze EMI problems using the Rohde & Schwarz Oscilloscopes. The discussion begins by covering the basic mechanisms that can result in unwanted RF emissions and then describes how to proceed in analyzing EMI problems. Finally, a practical example is given to illustrate the analysis process.

Englisch - 25.06.2014

This application note describes Battery Life Measurements with the R&S®RT-ZVC02/04 Multi-Channel Probe. The measurements are described with the use of an oscilloscope. The R&S®RT-ZVC Multi-Channel Probe can be used with R&S®RTE1000, R&S®RTO2000 or R&S®RTP.

Englisch - 17.01.2019

Oscilloscopes are the workhorses for power electronics engineers. With powerful and easyto- use FFT analysis capabilities, their application fields extend to EMI debugging – and that saves a lot of time and money. A typical task is verifying the effectiveness of an EMI filter – early in the development phase.

Englisch - 23.09.2019

A key challenge for embedded devices with DDR memories is to maintain signal integrity in the presence of power and ground rail fluctuations. This becomes even more important as supply voltages decrease and switching speed increases leading to tighter power rail tolerances and jitter requirements.

Englisch - 05.04.2017

Englisch - 12.01.2022

Simultaneously measure various current levels from μA to A in all phases of IoT device activity – from sleep to receive and transmit mode

Englisch - 01.10.2019

Power converter and inverter designs for higher power levels are usually based on hard switching half bridge configurations. In such setups, users must pay particular attention to proper switching operations to prevent shoot-through events. Setting up complex real-time trigger conditions using the R&S®RTE and R&S®RTO oscilloscopes increases the test coverage and robustness of converter and inverter systems.

Englisch - 10.08.2020

This application note describes how to use the mask and limit test features of the R&S®RTO, R&S®RTE and R&S®RTM Digital Oscilloscopes for EUT monitoring of signal forms, jitter etc. with the R&S®EMC32 Measurement Software. The mask test function allows autonomous characterization of digital signal integrity during EMS tests. R&S®EMC32 software records violations of userdefined limits or mask templates and evaluates the immunity threshold at frequencies of critical electromagnetic susceptibility.

Englisch - 20.04.2015

Englisch - 17.11.2015