Electronic Design testing – get in touch with the R&S®MXO 5

Electronic design

Get in touch with the R&S®MXO 5

電子回路開発者の要件に対応する電子計測ソリューション

今日の世界を動かしているものは、例えばIoT、インダストリー4.0、グリーンエネルギーなどの最新の産業的および経済的なテクノロジーとトレンドであり、もう一方はEヘルス、Eモビリティ、スマートホーム、スマートシティ、ソーシャルメディアといった個人のライフスタイルの根本的な変化です。これらのトレンドによって、ウェアラブルでありながら、接続性、パフォーマンス、電力効率、堅牢性、およびデータレートが高い、という困難な要件に対応する新世代の電子機器に対する需要が高まっています。

これらの需要に対応するために、電子技術者は統合基板アーキテクチャーのデザイン/開発時において、複雑な課題に直面しています。弊社の高機能な電子計測ソリューションには、従来のラボ設備とハンドヘルドツールが含まれており、以下の分野で数多くのアプリケーションに対応できます。

  • アナログ/デジタルデザインおよびテスト
  • デジタルバス&インタフェース規格
  • パワーエレクトロニクス
  • CATV / DOCSIS

弊社のソリューション

デジタルデザインのテスト

デジタルデザインのテスト

弊社の電子計測ソリューションは、信号&パワーインテグリティー、デジタルバス&インタフェース規格、アナログ/デジタル信号のシミュレーションと解析、EMCデバッグ、データ・コンバーター・デザインのすべてに対応できます。

詳しくは

高速デジタルインタフェーステスト

高速デジタルインタフェーステスト

高速デジタルインタフェースは、電子設計の核を成すものです。データレートの上昇と集積密度の向上により、IC、ボード、システムレベルの設計に新たな課題が生じます。

詳しくは

パワーエレクトロニクス

パワーエレクトロニクス

弊社のソリューションは、組み込み型パワーエレクトロニクス&IC、電子設備、照明、そして電気駆動試験の全てに対応できます。

詳しくは

CATV / DOCSIS

CATV / DOCSIS

DOCSIS 3.1ケーブルモデム終端システム(CMTS)、ケーブル・ネットワーク・アンプ、レーザー、ネットワークコンポーネント、およびケーブルモデムの包括的な試験。

詳しくは

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FAQs

What is design verification testing?

Verification of a device means checking that the performance of the device matches the expectations both during development and once development is complete. These expectations can be set internally by the organization commissioning the device, or externally by standards also available to other device developers.
For signal processing devices, the increasing complexity and speed of the device, and the reductions in signal levels together make verification ever more complex. Verification involves ensuring that signal values and parameters always remain within acceptable limits under a wide range of conditions.

What is electronics testing?

Electronics testing means checking that a circuit using semi-conductors is performing correctly. While electronics testing includes fundamental properties such as voltage, current, resistance, conductance and capacitance, almost certainly the properties of the signals transmitted by the circuit will be the major reason for testing. Measurements on signal integrity (quality) such as noise or distortion, or out of the stipulated frequency band do not require demodulation. If the data transmitted by the signal shall be tested to check whether the content is correct, demodulation functions for the appropriate data communication standard are required. The expected results of electronic testing depend on the stage in the life cycle of the device under test (DUT). During development, accurate measurements resulting in values to check against the specification are required. During production, high speed testing with a pass/fail result will meet the test requirements.

What is electronic testing used to test?

So long as “electronic” is taken to mean any circuit using semi-conductors to manipulate electrons, “electronic testing” is used to test any properties of the circuit that can be measured; almost entirely electrical properties, which can be measured at various levels. At the fundamental level, properties such as voltage, current, resistance, conductance and capacitance, can be measured using a multimeter. At the higher level of the signals transmitted by the circuit, measurements on signal integrity (quality) such as noise or distortion, or out of the stipulated frequency band, are measured with respect to frequency using signal and spectrum analysis, and with respect to time with oscilloscope functions. If the data transmitted by the signal shall be tested to check whether the content is correct, demodulation functions for the appropriate data communication standard are required.

What is signal and power integrity?

In electronics, integrity is whether the expected performance and characteristics of the signal processing from input signal to output signal are being met. Signal integrity refers to the quality of the signal, whether the signal waveform is as anticipated, and the degree to which the waveform is deformed by noise, jitter, and distortion. Power integrity refers to whether the anticipated voltage and current levels are present at all times at the selected test location in the circuit, and parameters such as unplanned variations in level, and planned speed of change in level. Integrity is inevitably associated with testing, as the degree of integrity can only demonstrated by taking measurements and comparing the results to the specification. Poor signal or power integrity results in reduced performance and data transmission errors.

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