Electronic Design testing – get in touch with the R&S®MXO 5

Electronic design

Get in touch with the R&S®MXO 5

Messtechniklösungen für Entwickler von elektronischen Schaltungen

Die Welt von heute wird einerseits durch die neuesten industriellen und wirtschaftlichen Techniken und Entwicklungen wie IoT, Industrie 4.0 und saubere Energie geprägt. Auf der anderen Seite haben fundamentale Änderungen in der persönlichen Lebensführung wie E-Health, Elektromobilität, Smart Homes, Smart Cities und soziale Medien einen großen Einfluss. All diese Entwicklungen erzeugen eine starke Nachfrage nach einer neuen Generation von Elektronikgeräten, die die großen Herausforderungen bezüglich Tragbarkeit, Mobilität, Konnektivität, Performance, Energieeffizienz, Robustheit und höchster Datenraten meistern.

Infolgedessen sehen sich Elektronikingenieure mit immer komplexeren Herausforderungen beim Design und der Entwicklung von integrierten Platinenarchitekturen konfrontiert. Unsere hochmodernen Messtechniklösungen umfassen sowohl klassische Labor- als auch tragbare Geräte und unterstützen Applikationen auf folgenden Gebieten:

  • Messtechnik für Analog-/Digitaldesign
  • Digitale Bus- und Schnittstellenstandards
  • Leistungselektronik
  • Kabelfernsehen/DOCSIS

Unsere Lösungen

Messtechnik für digitale Designs

Messtechnik für digitale Designs

Wählen Sie aus unseren umfassenden Messtechniklösungen für Signalintegrität und Power Integrity, digitale Bus- und Schnittstellenstandards, Stimulation und Analyse von analogen/digitalen Signalen, EMV-Fehlersuche und Design von Datenumsetzern.

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Messtechnik für schnelle digitale Schnittstellen

Messtechnik für schnelle digitale Schnittstellen

Schnelle digitale Schnittstellen sind heute aus keinem Elektronikdesign mehr wegzudenken. Die immer höheren Datenraten und zunehmende Integrationsdichte stellen auf IC-, Baugruppen- und Systemebene neue Anforderungen an die Designs.

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Leistungselektronik

Leistungselektronik

Meistern Sie alle Aspekte von Leistungselektroniktests mit unseren Lösungen für eingebettete Leistungselektronik und integrierte Schaltkreise, Elektroinstallationen, Beleuchtung und elektrische Antriebe.

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Kabelfernsehen/DOCSIS

Kabelfernsehen/DOCSIS

Umfassende Tests von DOCSIS-3.1-Kabelkopfstellen (CMTS), Kabelnetzverstärkern, Lasern, Netzwerkkomponenten und Kabelmodems.

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Knowledge+

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Video center

Video center

Get access to interesting videos and webinars about solutions, applications and products.

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Downloadcenter

Download Center

Search the Rohde & Schwarz download center for brochures, datasheets, technical papers, manuals, firmware, software, drivers, and more.

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The Rohde & Schwarz Technology Academy

You’re in great hands
Practical knowledge. Industry insight. Real experts. Only with the Rohde & Schwarz Technology Academy.

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Rohde & Schwarz at Embedded-world 2024 in Nuremberg

Rohde & Schwarz at embedded world 2024 in Nuremberg

Test & measurement for embedded systems

Solving complex test and measurement challenges requires innovative solutions from a reliable partner.

Join us at our booth in hall 4 I booth 218 from April 9 to April 11, 2024.

FAQs

What is design verification testing?

Verification of a device means checking that the performance of the device matches the expectations both during development and once development is complete. These expectations can be set internally by the organization commissioning the device, or externally by standards also available to other device developers.
For signal processing devices, the increasing complexity and speed of the device, and the reductions in signal levels together make verification ever more complex. Verification involves ensuring that signal values and parameters always remain within acceptable limits under a wide range of conditions.

What is electronics testing?

Electronics testing means checking that a circuit using semi-conductors is performing correctly. While electronics testing includes fundamental properties such as voltage, current, resistance, conductance and capacitance, almost certainly the properties of the signals transmitted by the circuit will be the major reason for testing. Measurements on signal integrity (quality) such as noise or distortion, or out of the stipulated frequency band do not require demodulation. If the data transmitted by the signal shall be tested to check whether the content is correct, demodulation functions for the appropriate data communication standard are required. The expected results of electronic testing depend on the stage in the life cycle of the device under test (DUT). During development, accurate measurements resulting in values to check against the specification are required. During production, high speed testing with a pass/fail result will meet the test requirements.

What is electronic testing used to test?

So long as “electronic” is taken to mean any circuit using semi-conductors to manipulate electrons, “electronic testing” is used to test any properties of the circuit that can be measured; almost entirely electrical properties, which can be measured at various levels. At the fundamental level, properties such as voltage, current, resistance, conductance and capacitance, can be measured using a multimeter. At the higher level of the signals transmitted by the circuit, measurements on signal integrity (quality) such as noise or distortion, or out of the stipulated frequency band, are measured with respect to frequency using signal and spectrum analysis, and with respect to time with oscilloscope functions. If the data transmitted by the signal shall be tested to check whether the content is correct, demodulation functions for the appropriate data communication standard are required.

What is signal and power integrity?

In electronics, integrity is whether the expected performance and characteristics of the signal processing from input signal to output signal are being met. Signal integrity refers to the quality of the signal, whether the signal waveform is as anticipated, and the degree to which the waveform is deformed by noise, jitter, and distortion. Power integrity refers to whether the anticipated voltage and current levels are present at all times at the selected test location in the circuit, and parameters such as unplanned variations in level, and planned speed of change in level. Integrity is inevitably associated with testing, as the degree of integrity can only demonstrated by taking measurements and comparing the results to the specification. Poor signal or power integrity results in reduced performance and data transmission errors.

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